Low Voltage Recommended Practices

C62.41.2-2002 - IEEE Recommended Practice on Characterization of Surges in Low-Voltage (1000 V and less) AC Power Circuits
Description: The scope of this recommended practice is to characterize the surge environment at locations on AC power circuits described in IEEE Std C62.41.1/sup TM/2002 by means of standardized waveforms and other stress parameters. The surges considered in this recommended practice do not exceed one half-cycle of the normal mains waveform (fundamental frequency) in duration. They can be periodic or random events and can appear in any combination of line, neutral, or grounding conductors. They include surges with amplitudes, durations, or rates of change sufficient to cause equipment damage or operational upset. While surge protective devices (SPDs) acting primarily on the amplitude of the voltage or current are often applied to divert the damaging surges, the upsetting surges might require other remedies.
Working Group: 3.6.4 Surge Characterization on LV Circuits WG

C62.41.2-2002/Cor 1-2012 - IEEE Recommended Practice on Characterization of Surges in Low-Voltage (1000 V and Less) AC Power Circuits Corrigendum 1: Deletion of Table A.2 and Associated Text
Description: Deletion of Table A.2 and associated text is addressed in this corrigendum.
Working Group: 3.6.4 Surge Characterization on LV Circuits WG

C62.45-2002 - IEEE Recommended Practice on Surge Testing for Equipment Connected to Low-Voltage (1000 V and less) AC Power Circuits
Description: The scope of this recommended practice is the performance of surge testing on electrical and electronic equipment connected to low-voltage ac power circuits, specifically using the recommended test waveforms defined in IEEE Std C62.41.2 -2002. Nevertheless, these recommendations are applicable to any surge testing, regardless of the specific surges that may be applied.
Working Group: 3.6.4 Surge Characterization on LV Circuits WG