Low Voltage Standard Projects

IEEE-SA Project Authorisation Requests (PARs)
(retrieved 2016-06)

PC62.33: Standard for Test Methods and Performance Values of Metal-Oxide Varistor Surge Protective Components

Status: SPDC WG 3.6.2 PAR for C62.33-1982

 Scope: This standard covers test methods and performance values of Metal-Oxide Varistor (MOV) surge protection components with the following main parameter ranges:

*Packaging: leaded disc-type or surface mount

*Nominal MOV voltage: 5 V to 1200 V

*8/20 surge current rating: 10 A to 70 kA

*8/20 clamping voltage: 10 V to 3 kV

With appropriate component selection, these components could be used for the overvoltage protection of power and signal systems having:

*Continuous AC voltages: 2.5 V rms to 750 V rms

*Continuous DC voltages: 3.3 V to 1000 V

*Peak signal feed voltages: 3.5 V to 850 V

Information is given on manufacturer type testing used to determine environmental performance and rated values.

PAR Expiration Date: 31-Dec-2015

 

PC62.34: Standard for Test Methods and Performance of Low-Voltage (1000 V rms or less) Surge Protective Devices Used on Secondary Distribution Systems (Between the Transformer Low-Voltage Terminals and the Line Side of the Service Entrance Equipment)

Status: SPDC WG 3.6.9 Revision of C62.34-1996

Scope: This standard applies to surge protective devices designed for application on the low-voltage supply mains (1000 V rms and less, frequency between 48 and 62 Hz) and intended to be connected at locations between, and including, the secondary terminals of the distribution transformer and the line side of the service entrance equipment. Such surge protective devices are also known as secondary arresters. This is coordinated with C62.44 (the application guide), NEC Article 285, and ANSI/UL 1449-2006

PAR Expiration Date: 31-Dec-2012

 

PC62.59: Standard for Test Methods and Preferred Values for Voltage Limiting, Clamping-Type, PN Junction Surge Protective Components

Status: SPDC WG 3.6.2 PAR for a new IEEE Standard

Scope: This standard sets terms, test methods, test circuits, measurement procedures and preferred result values for components with silicon PN, NPN or PNP junction chip structures used for surge voltage clamping in low-voltage systems. The technology types covered are:

  • forward biased diodes
  • Zener breakdown diodes
  • avalanche breakdown diodes
  • punch-through diodes
  • fold-back diodes

This standard does not cover thyristor surge protective components, see (b-IEEE Std C62.37)

PAR Expiration Date: 31-Dec-2019

 

PC62.62: Standard Test Specifications for Surge-Protective Devices (SPDs) for Use on the Load Side of the Service Equipment in Low-Voltage (1000 V and Less) AC Power Circuits

Status: SPDC WG 3.6.6 PAR for revision of C62.62

Scope: This standard applies to surge-protective devices (SPDs) intended to be installed on the load side of the service equipment connected to 50 Hz or 60 Hz alternating current (ac) power circuits rated at 1000 V (root mean squared [rms]) or less. Performance characteristics and standard methods for testing and rating are established for these devices, which may be composed of any combination of components. The tests in this standard are aimed at providing comparisons among the variety of surge-protective devices available.

PAR Expiration Date: 31-Dec-2018